Neutron irradiation effects on highly oriented antiferroelectric PbZrO3 (PZ) thin films are investigated in view of their possible application as a temperature sensitive element in an alternative bolometer system for fusion devices such as the International Thermonuclear Experimental Reactor (ITER). All films were prepared by a sol-gel technique or by pulsed laser deposition (PLD). The dielectric properties were investigated in a frequency range from 1 to 250kHz and at temperatures up to 400°C, prior to and after irradiation to neutron fluences of 0.5×1022, 1×1022, 2×1022, and 3×1022m−2 (E>0.1MeV). After irradiation, the films were annealed in several steps up to 400°C in order to remove the radiation-induced defects. The results are discussed in terms of a phenomenological model of radiation effects in PZ films, which takes into account structural defects, such as oxygen vacancies, and radiation-induced charges. We find that the films are most sensitive to neutron irradiation in the vicinity of the phase transistion temperature Tc. In addition, the structural order of the films as well as the interfaces play an important role. We find that the PZ heterostructures prepared by PLD are radiation harder than the sol-gel films. The dielectric properties of the PLD films are more or less unaffected by neutron irradiation up to a fluence of 3×1022m−2 (E>0.1MeV).
Despite wide studies of Na0.5Bi0.5TiO3, structure of this material and its connection with the observed physical properties still raise numerous questions due to mutually contradicting results obtained. Here, structure and dielectric properties of poled and unpoled Na0.5Bi0.5TiO3-CaTiO3 solid solutions are studied, projecting the obtained concentration dependence of structure and dielectric properties on pure Na0.5Bi0.5TiO3 as the end member of this material group. X-ray diffraction patterns for Na0.5Bi0.5TiO3-CaTiO3 solid solutions reveal dominating of an orthorhombic Pnma phase, even for the compositions approaching the end composition (Na0.5Bi0.5TiO3), whereas structure of pure Na0.5Bi0.5TiO3 can be considered, assuming coexistence of rhombohedral and orthorhombic phases. This allows one to avoid appearance of a large difference of rhombohedral distortions between the unpoled and poled Na0.5Bi0.5TiO3, if the rhombohedral distortion is calculated as for single R3c phase. Features of dielectric permittivity, corresponding to the observed structural phase transition, are identified. It is discussed that the rhombohedral R3c phase is responsible for appearance of the frequency-dependent shoulder of dielectric permittivity temperature dependence, characteristic for unpoled Na0.5Bi0.5TiO3.
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