Increases in peak current draw and reductions in the operating voltage of processors stress the importance of dealing with voltage fluctuations in processors. Noise-margin violations lead to undesired effects, like timing violations, which may result in incorrect execution of applications. Several recent architectural solutions for inductive noise have been proposed that, unfortunately, have a strong correlation to the underlying power-delivery package model and require a feedback loop that is largely constrained by the voltage/current sensor characteristics. The resulting solutions are not robust across a wide range of microprocessor designs and packaging technologies. This paper proposes a DelayedCommit and Rollback scheme (DeCoR) that guarantees correctness, insensitive to the package model or the responsiveness of the voltage sensors. In particular, our approach recovers from, rather than attempting to avoid, voltage emergencies. This approach incurs a small performance penalty when compared to an ideal machine that does not have voltage emergencies. We show that explicit checkpoint-recovery schemes, intended to handle infrequent events, e.g., radiation-induced soft errors, suffer from large performance overheads for frequently-occurring voltage emergencies. DeCoR requires very few modifications to modern processor designs, as it leverages the existing store queue and reorder buffers. Unlike conventional designs that conservatively protect all components of the processor from inductive noise with overly-large timing margins, our approach only requires conservative protection of the architected register state and cache write paths.
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. One approach suggested has been to not only react to these fluctuations but also attempt to eliminate future occurrences of these fluctuations by dynamically modifying the executing program. This paper investigates the potential of a very simple dynamic scheme to appreciably reduce the number of run-time voltage emergencies. It shows that we can map many of the voltage emergencies in the execution of the SPEC2000 benchmarks on an aggressive superscalar design to a few static loops, categorize the microarchitectural cause of the emergencies in each important loop through simple observations and a simple priority function, and finally apply straightforward software optimization strategies to mitigate up to 70% of the future voltage swings.
Dynamic voltage and frequency scaling (DVFS) is a commonly-used power-management scheme that dynamically adjusts power and performance to the time-varying needs of running programs. Unfortunately, conventional DVFS, relying on off-chip regulators, faces limitations in terms of temporal granularity and high costs when considered for future multi-core systems. To overcome these challenges, this paper presents thread motion (TM), a fine-grained power-management scheme for chip multiprocessors (CMPs). Instead of incurring the high cost of changing the voltage and frequency of different cores, TM enables rapid movement of threads to adapt the time-varying computing needs of running applications to a mixture of cores with fixed but different power/performance levels. Results show that for the same power budget, two voltage/frequency levels are sufficient to provide performance gains commensurate to idealized scenarios using per-core voltage control. Thread motion extends workload-based power management into the nanosecond realm and, for a given power budget, provides up to 20% better performance than coarse-grained DVFS.
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