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In this article, several experimental results were reported for the evaluation of the first crystallization speed ͑v 1st ͒ on the nanosecond time scale as well as the material characteristics of the Ag-added Ag-In-Sb-Te films. The ͑Ag͒ x ͑Ag 5.5 In 6.5 Sb 59 Te 29 ͒ 1−x ͑x = 0, 0.1, and 0.2͒ films were prepared by thermal evaporation and their phase transformation from an amorphous state to a hexagonal structure via a stable fcc structure was confirmed using x-ray diffraction. Some differences were measured in the optical transmittance ͑T OP ͒ and absorption between the amorphous and crystalline films in the wavelength ͑͒ range of 800-3000 nm using an UV-visible-IR spectrophotometer. The v 1st values, evaluated using nanopulse reflection response, slightly improved with an increase in the Ag content. For example, the nucleation time/average growth time ratio for the Ag 5.5 In 6.5 Sb 59 Te 29 and Ag 0.2 ͑Ag 5.5 In 6.5 Sb 59 Te 29 ͒ 0.8 films were approximately 170 ns/70 ns and 110 ns/60 ns, respectively, for an illumination power of 7 mW.

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