This paper reports a thorough microstructural characterization of glancing angle deposited (GLAD) TiO(2) thin films. Atomic force microscopy (afm), grazing-incidence small-angle x-ray scattering (GISAXS) and water adsorption isotherms have been used to determine the evolution of porosity and the existence of some correlation distances between the nanocolumns constituting the basic elements of the film's nanostructure. It is found that the deposition angle and, to a lesser extent, the film thickness are the most important parameters controlling properties of the thin film. The importance of porosity and some critical dimensions encountered in the investigated GLAD thin films is highlighted in relation to the analysis of their optical properties when utilized as antireflective coatings or as hosts and templates for the development of new composite materials.

A simple method is presented to tune the gold surface plasmon resonance (SPR) modes by growing anisotropic nanoparticles into transparent SiO2 thin films prepared by glancing angle deposition. In this type of composite film, the anisotropy of the gold nanoparticles, proved by gracing incidence small angle X‐ray scattering, is determined by the tilted nanocolumnar structure of the SiO2 host and yields a strong film dichroism evidenced by a change from an intense colored to a nearly transparent aspect depending on light polarization and/or sample orientation. The formation in these films of lithographic non‐dichroic SPR patterns by nanosecond laser writing demonstrates the potentialities of this procedure to develop novel optical encryption or anti‐counterfeiting structures either at micrometer‐ or macroscales.

The growth of nanostructured physical vapor deposited thin films at oblique angles is becoming a hot topic for the development of a large variety of applications. Up to now, empirical relations, such as the so-called tangent rule, have been uncritically applied to account for the development of the nanostructure of these thin films even when they do not accurately reproduce most experimental results. In the present paper, the growth of thin films at oblique angles is analyzed under the premises of a recently proposed surface trapping mechanism. We demonstrate that this process mediates the effective shadowing area and determines the relation between the incident angle of the deposition flux and the 2 tilt angle of the columnar thin film nanostructures. The analysis of experimental data for a large variety of materials obtained in our laboratory and taken from the literature supports the existence of a connection between the surface trapping efficiency and the metallic character of the deposited materials. The implications of these predictive conclusions for the development of new applications based on oblique angle deposited thin films are discussed.

Porous Bragg microcavities formed by stacking a series of porous nanocolumnar layers with alternate low (SiO2) and high (TiO2) refractive index materials have been prepared by physical vapor deposition at glancing angles (GLAD). By strictly controlling the porosity and refractive index of the individual films, as well as the relative orientation of the nanocolumns from one layer to the next, very porous and nondispersive high optical quality microcavities have been manufactured. These photonic structures have been implemented into responsive devices to characterize liquids, mixtures of liquids, or solutions flowing through them. The large displacements observed in the optical spectral features (Bragg reflector gap and resonant peak) of the photonic structures have been quantitatively correlated by optical modeling with the refractive index of the circulating liquids. Experiments carried out with different glucose and NaCl solutions and mixtures of water plus glycerol illustrate the potentialities of these materials to serve as optofluidic devices to determine the concentration of solutions or the proportion of two phases in a liquid mixture.

In general, cracking of thin films is synonym of irreversible damage, delamination and/or device failure. Nevertheless, under certain well controlled conditions, a tensile stress applied to a supported film can induce the development of a regular pattern perpendicular to the resulting strain 11,12 . For example, patterns of cracks produced by uniaxial straining of plasma surface

ITO thin films have been prepared by electron beam evaporation at oblique angles (OA), directly and while assisting their growth with a downstream plasma. The films microstructure, characterized by scanning electron microscopy, atomic force microscopy and glancing incidence small angle X-ray scattering, consisted of tilted and separated nanostructures. In the plasma 2 assisted films, the tilting angle decreased and the nanocolumns became associated in the form of bundles along the direction perpendicular to the flux of evaporated material. The annealed films presented different in-depth and sheet resistivity as confirmed by scanning conductivity measurements taken for the individual nanocolumns. In addition, for the plasma assisted thin films, two different sheet resistance values were determined by measuring along the nanocolumn bundles or along the perpendicular direction. This in-plane anisotropy induces the electrochemical deposition of elongated gold nanostructures. The obtained Au-ITO composite thin films were characterized by anisotropic plasmon resonance absorption and a dichroic behavior when examined with linearly polarized light.

A flexible distributed Bragg reflector is made by the infiltration of a nanocolumnar array with polydimethyl siloxane oligomers. The high optical reflectance displayed by the final material is a direct consequence of the high refractive index contrast of the columnar layers whereas the structural stability is due to the polymer properties.

In this article we present the preactivation of TiO2 and ITO by UV irradiation under ambient conditions as a tool to enhance the incorporation of organic molecules on these oxides by evaporation at low pressures. The deposition of π-stacked molecules on TiO2 and ITO at controlled substrate temperature and in the presence of Ar is thoroughly followed by SEM, UV-vis, XRD, RBS, and photoluminescence spectroscopy, and the effect is exploited for the patterning formation of small-molecule organic nanowires (ONWs). X-ray photoelectron spectroscopy (XPS) in situ experiments and molecular dynamics simulations add critical information to fully elucidate the mechanism behind the increase in the number of adsorption centers for the organic molecules. Finally, the formation of hybrid organic/inorganic semiconductors is also explored as a result of the controlled vacuum sublimation of organic molecules on the open thin film microstructure of mesoporous TiO2.