Selective laser sintering (SLS) is a leading process for developing rapid prototype objects by selectively fusing layers of powder according to numerically defined cross‐sectional geometry. The process has the potential to become an indispensable industrial tool. However, continuous process improvement is necessary. Improved understanding of the parameter effects on the process response is expected to lead to process advances. In this work the analytical problem describing the energy delivery, heat transfer and sintering process along with other pertinent phenomena is studied. Physical experiments and implementation of a numerical simulation are conducted using Bisphenol‐A polycarbonate. The effects of selected parameters on the SLS process response are examined. The primary parameters of interest are the laser power, laser beam velocity, hatch spacing, laser beam spot size and scan line length. This work shows that the secondary process parameters, delay period and number of effective exposures have a significant influence on the process response.

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In this contribution we present results of differential sputter yield measurements of boron nitride, quartz, and kapton due to bombardment by xenon ions. The measurements are made using a sputtering diagnostic based on a quartz crystal microbalance (QCM). The QCM measurement allows full angular resolution, i.e. differential sputtering yield measurements are measured as a function of both polar angle and azimuthal angle. Measured profiles are presented for 100, 250, 350 and 500 eV Xe + bombardment at 0º, 15º, 30º and 45º angles of incidence. We fit the measured profiles with Modified Zhang expressions using two free parameters: the total sputter yield, Y, and characteristic energy E*. Total yields are calculated from the differential profiles and are compared with published values and weight loss values where possible. φ = azimuthal angle in the target plane from the plane containing the ion beam and target normal ρ = density of target material I.

We report on use of cavity ring-down spectroscopy (CRDS) as a means to detect and quantify ion sputtering of refractory metal species. CRDS measurements are made with a neodymium:YAG-pumped optical parametric oscillator laser system in the 375-400 nm region. CRDS sputtering measurements are presented for argon ions incident on iron, aluminum, molybdenum, and titanium. The measurements are based on absorption from fine-structure levels of the electronic ground-state multiplets. For each species, characteristic spectra are provided, the dependence of sputtered particle number density on the beam current is examined, measured densities are compared with a sputter model, and detection limits are determined. For iron, aluminum, and titanium we probe multiple fine-structure levels within the ground-state multiplet and obtain information on their relative populations.

We report differential sputter yield measurements for Xe+ ions incident on molybdenum for ion incidence angles of 0°, 15°, 30° and 45°, and ion energies of 250, 350, 500 and 750 eV. The angularly resolved profiles are obtained with a quartz crystal microbalance that is moved to a series of locations above the target. Total sputter yields found by integrating the differential sputter yields are in accord with the literature values. For normally incident ions the profiles are under-cosine, while for obliquely incident ions the profiles show azimuthal variation with pronounced forward sputtering lobes. We discuss the use of published expressions from Zhang and Zhang (2004 Radiat. Eff. Defects Solids 159 301–7) for describing the measured profiles. We find that the profiles can be reasonably described with these expressions by using two free parameters: the total sputter yield (Y) and a characteristic energy (E*). We compare changes in angular sputtering profiles from lightly versus heavily sputtered targets.