<p class="MsoNormal" style="text-align: left; margin: 0cm 0cm 0pt; layout-grid-mode: char;" align="left"><span class="text"><span style="font-family: ";Arial";,";sans-serif";; font-size: 9pt;">Inside a modern flat-panel display, the TFT array acts as the analog memory that stores the image information. To ensure high overall yield, it is crucial to thoroughly test the TFT array before it enters the assembly line. However, TFT array testing gets complicated in system-on-panel displays because the peripheral circuits integrated on the same substrate as the array limit the access to the array’s inputs and outputs. This paper presents a builtin source driver design to facilitate TFT array testing for system-on-panel displays. In addition to writing data to the TFT array pixels, the proposed source driver is capable of executing the charge-sensing test and serial read-out of the charge-</span></span><span style="font-family: ";Arial";,";sans-serif";; font-size: 9pt;"> <span class="text">sensing results—both help reduce the required test equipment performance and complexity. The proposed source driver has been designed in LTPS technology. Circuit simulation results are shown to validate its performance.</span></span></p>
The field emission array (FEA), when used as a display device, requires a s c m h g driving circuit. Due to the large FEA capacitance (typically 5 pF for one pixel), the driving circuit is usually slow. In this work, a new driving circuit, which employs the voltage controlled current source (VCCS), overcomes the above-mentioned problem, thus can reach a high driving speed. In addition, the circuit has the advantages of a uniform current driving, the gray level control and the low power consumption.
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