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The paper presents an equivalent circuit snapback model lor the ESD domain operation of merged cascoded NMOS devices. The model reflects the specific breakdown operation of the structure at different gate bias conditions. An example for optimisation of the ESD behaviour of an output driver, utilising this protection device, is presented.

Fully working 1.25pm' 6T-SRAM cell with 45nm Triple Gate transistors having excellent short-channel characteristics is demonstrated by using a planar layout of 90nm CMOS technology. This result represents the first experimental demonstration of a fully working Triple Gate SRAM cell with the smallest cell size ever reported.

Recently spaceborne SAR systems are increasing image resolution and frequency. As a high quality image resolution, the wider bandwidth is required and a wideband signal generator with RF component is very complicated and RF impairments of device is increased. Therefore, it is very important to improve performance by reducing these errors. In this study, the transmission signal of the wideband signal generator is applied to the phase noise, IQ imbalance, ripple gain, nonlinear model of high power amplifier. And we define possible structures of wideband signal generator and measure the PSLR and ISLR for the performance assesment. Also, we extract error of the amplitude and phase from the waveform and use a quadratic polynomial curve fitting and examine the performance change due to nonlinear device. Finally, we apply a high power amplifier predistortion method for non-linear error compensation. And we confirm that distortion in the output of the amplifier by intermodulation component is decreased by 15 dB.

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