In the past, the estimation of crowd density has become an important topic in the field of automatic surveillance systems. In this paper, the developed system goes one step further to estimate the number of people in crowded scenes in a complex background by using a single image. Therefore, more valuable information than crowd density can be obtained. There are two major steps in this system: recognition of the head-like contour and estimation of crowd size. First, the Haar wavelet transform (HWT) is used to extract the featured area of the head-like contour, and then the support vector machine (SVM) is used to classify these featured area as the contour of a head or not. Next, the perspective transforming technique of computer vision is used to estimate crowd size more accurately. Finally, a model world is constructed to test this proposed system and the system is also applied for real-world images.
Transparent conductive oxide of Ta-doped ZnO (TZO) film with doping amount of 3.0 wt% have been deposited on glass substrates (Corning Eagle XG) at substrate temperatures of 100 to 500 degrees C by the pulsed laser deposition (PLD) technique. The effect of substrate temperature on the structural, optical and electronic characteristics of Ta-doped ZnO (TZO) films with 3.0 wt% dopant of tantalum oxide (Ta2O5) was measured and demonstrated in terms of X-ray diffraction (XRD), ultraviolet-visible spectrometer (UV-Vis), four-probe and Hall-effect measurements. X-ray diffraction pattern shows that TZO films grow in hexagonal crystal structure of wurtzite phase with a preferred orientation of the crystallites along (002) direction and exhibits better physical characteristics of optical transmittance, electrical conductivity, carrier concentration and mobility for the application of window layer in the optoelectronic devices of solar cells, OLEDs and LEDs. The lowest electrical resistivity (ρ) and the highest carrier concentration of the as-deposited film deposited at 300 degrees C are measured as 2.6 x 10(-3) Ω-cm and 3.87 x 10(-20) cm(-3), respectively. The highest optical transmittance of the as-deposited film deposited at 500 degrees C is shown to be 93%, compared with another films deposited below 300 degrees C. It is found that electrical and optical properties of the as-deposited TZO film are greatly dependent on substrate temperature during laser ablation deposition.
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