The characterization and reconstruction of heterogeneous materials, such as porous media and electrode materials, involve the application of image processing methods to data acquired by scanning electron microscopy or other microscopy techniques. Among them, binarization and decimation are critical in order to compute the correlation functions that characterize the microstructure of the above-mentioned materials. In this study, we present a theoretical analysis of the effects of the image-size reduction, due to the progressive and sequential decimation of the original image. Three different decimation procedures (random, bilinear, and bicubic) were implemented and their consequences on the discrete correlation functions (two-point, line-path, and pore-size distribution) and the coarseness (derived from the local volume fraction) are reported and analyzed. The chosen statistical descriptors (correlation functions and coarseness) are typically employed to characterize and reconstruct heterogeneous materials. A normalization for each of the correlation functions has been performed. When the loss of statistical information has not been significant for a decimated image, its normalized correlation function is forecast by the trend of the original image (reference function). In contrast, when the decimated image does not hold statistical evidence of the original one, the normalized correlation function diverts from the reference function. Moreover, the equally weighted sum of the average of the squared difference, between the discrete correlation functions of the decimated images and the reference functions, leads to a definition of an overall error. During the first stages of the gradual decimation, the error remains relatively small and independent of the decimation procedure. Above a threshold defined by the correlation length of the reference function, the error becomes a function of the number of decimation steps. At this stage, some statistical information is lost and the error becomes dependent on the decimation procedure. These results may help us to restrict the amount of information that one can afford to lose during a decimation process, in order to reduce the computational and memory cost, when one aims to diminish the time consumed by a characterization or reconstruction technique, yet maintaining the statistical quality of the digitized sample.

The pixel's classification of images obtained from random heterogeneous materials is a relevant step to compute their physical properties, like Effective Transport Coefficients (ETC), during a characterization process as stochastic reconstruction. A bad classification will impact on the computed properties; however, the literature on the topic discusses mainly the correlation functions or the properties formulae, giving little or no attention to the classification; authors mention either the use of a threshold or, in few cases, the use of Otsu's method. This paper presents a classification approach based on Support Vector Machines (SVM) and a comparison with the Otsu's-based approach, based on accuracy and precision. The data used for the SVM training are the key for a better classification; these data are the grayscale value, the magnitude and direction of pixels gradient. For instance, in the case study, the accuracy of the pixel's classification is 77.6% for the SVM method and 40.9% for Otsu's method. Finally, a discussion about the impact on the correlation functions is presented in order to show the benefits of the proposal.

This paper presents a virtual laboratory for the computer processing of digital imaging. This software application is designed to enhance/reconstruct high-resolution images in order to analyze the implemented algorithms as well as their optical features. The application is conceived as a virtual laboratory for mechatronic, biomedical and electronic engineering students. The presented case studies demonstrate the accuracy of the processing chain used in this virtual laboratory, and how the students could better understand topics related to remote sensing, computer vision, biomedical engineering, among others.

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Electrochemical electrodes comprise multiple phenomena at different scales. Several works have tried to model such phenomena using statistical techniques. This paper proposes a novel process to work with reduced size images to reconstruct microstructures with the Simulated Annealing method. Later, using the Finite Volume Method, it is verified the effect of the image resolution on the effective transport coefficient (ETC). The method can be applied to synthetic images or images from the Scanning Electron Microscope. The first stage consists of obtaining the image of minimum size, which contains at least 98% of the statistical information of the original image, allowing an equivalent statistical study. The image size reduction was made by applying an iterative decimation over the image using the normalized coarseness to compare the amount of information contained at each step. Representative improvements, especially in processing time, are achieved by reducing the size of the reconstructed microstructures without affecting their statistical behavior. The process ends computing the conduction efficiency from the microstructures. The simulation results, obtained from two kinds of images from different materials, demonstrate the effectivity of the proposed approach. It is important to remark that the controlled decimation allows a reduction of the processor and memory use during the reconstruction and ETC computation of electrodes.

The study of the microstructure of random heterogeneous materials, related to an electrochemical device, is relevant because their effective macroscopic properties, e.g., electrical or proton conductivity, are a function of their effective transport coefficients (ETC). The magnitude of ETC depends on the distribution and properties of the material phase. In this work, an algorithm is developed to generate stochastic two-phase (binary) image configurations with multiple geometries and polydispersed particle sizes. The recognizable geometry in the images is represented by the white phase dispersed and characterized by statistical descriptors (two-point and line-path correlation functions). Percolation is obtained for the geometries by identifying an infinite cluster to guarantee the connection between the edges of the microstructures. Finally, the finite volume method is used to determine the ETC. Agglomerate phase results show that the geometry with the highest local current distribution is the triangular geometry. In the matrix phase, the most significant results are obtained by circular geometry, while the lowest is obtained by the 3-sided polygon. The proposed methodology allows to establish criteria based on percolation and surface fraction to assure effective electrical conduction according to their geometric distribution; results provide an insight for the microstructure development with high projection to be used to improve the electrode of a Membrane Electrode Assembly (MEA).

This work presents a set of laboratory sessions that can be carried out by students of Digital Design courses required in engineering carrers like Electronics, Communications, Mechatronics, etc. The purpose of these lab is that the students develop their skills and confidence in the design of arithmetic hardware blocks by presenting them specific problems. In this sense, this paper shows a design methodology to be performed in a laboratory for the design of arithmetic blocks which can be implemented in microcontrollers and FPGAs. More specifically, we present the block design of a number's multiplicative inverse (𝟏 𝒙 ⁄ ), its square root (√𝒙) and the square root of its inverse (𝟏 √𝒙 ⁄ ). The completion of these exercises requires the application of the Newton-Raphson algorithm, polynomial approximations of functions, difference equations and digital design. Students of our institution completed the lab sessions and after analyzing the results of student surveys and classroom observations, we found out that completing these tasks significantly contributed to the students' training in the hardware design field.

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