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We report on the development and validation of a new methodology for the determination of anisotropic tracer diffusion and surface exchange coefficients of high quality epitaxial thin films in the two perpendicular directions (transverse and longitudinal), by the isotopic exchange technique. Measurements were performed on c-axis oriented La 2 NiO 4+d films grown on SrTiO 3 (100) and NdGaO 3 (110) by pulsed injection metal organic chemical vapour deposition (PIMOCVD), with different thicknesses ranging from 33 to 370 nm. The effect that the strain induced by the film-substrate mismatch has on the oxygen diffusion through the film was evaluated. Both tracer diffusion coefficients, along the c-axis and along the ab plane, were found to increase with film thickness, i.e., as the stress of the film decreases, while the thickness seems to have no effect on the tracer surface exchange coefficient. Best fits were obtained when considering the thickest films composed by two regions with different c-axis tracer diffusion coefficient values, a higher and constant D* close to the film surface and a variable decreasing D* closer to the substrate. As expected, the tracer diffusion and surface exchange coefficients are thermally activated and are approximately two orders of magnitude higher along the ab plane than along the c-axis. The low activation energies of D* compared with bulk values for both directions at low temperatures seem to confirm the contribution of a vacancy mechanism to the ionic conduction.

Strain engineering of functional properties in epitaxial thin films of strongly correlated oxides exhibiting octahedral-framework structures is hindered by the lack of adequate misfit relaxation models. Here we present unreported experimental evidence of a four-stage hierarchical development of octahedral-framework perturbations resulting from a progressive imbalance between electronic, elastic, and octahedral tilting energies in La(0.7)Sr(0.3)MnO(3) epitaxial thin films grown on SrTiO(3) substrates. Electronic softening of the Mn-O bonds near the substrate leads to the formation of an interfacial layer clamped to the substrate with strongly degraded magnetotransport properties, i.e., the so-called dead layer, while rigid octahedral tilts become relevant at advanced growth stages without significant effects on charge transport and magnetic ordering.

We report a method to fabricate functional oxide nanostructures ordered over the centimeter scale. Self-assembly of SrTiO3(001) chemical terminations through appropriate thermal processing leads to large-area chemical nanopattering of the surface. Such nanopatterned surfaces, stable at relatively high temperature, can be used as template to grow functional ordered nanostructures, exploiting the termination-dependent nucleation. As an example of this potential, we have fabricated ordered arrays of conducting epitaxial SrRuO3 nanostripes separated by insulating trenches. Conductivity maps by atomic force microscopy confirm the coexistence of sharp conducting/insulating regions in low-dimensional structures.