We have reconstructed thumb defects using microsurgical techniques in 43 patients. The flap survival was 100% and functional improvement with near normal appearance was obtained in the reconstructed thumbs. In order to obtain satisfactory results, donor sites were confined to the great toe and its adjacent structures and adventitia was removed from the vascular pedicle, which was transferred by subcutaneous tunnelling to minimize scar formation in the reconstructed thumb. The width of transferred nail and pulp volume were matched to the defect in the thumb before transfer.

We investigate carrier localization in the InAs/AlSb type-II superlattice (T2SL) material system using temperature- and excitation power (Iex)-dependent photoluminescence (PL). Evidence of carrier localization in T2SLs was observed by an S-shaped temperature dependence of the PL peak position. Analysis of the Iex-dependent PL at various temperatures also shows the existence of carrier localization in the T2SLs. The thermal activation energies in T2SLs were extracted to identify the nonradiative recombination mechanisms and the possible origins of localized states. We found that there are two thermal activation energies, E1 = 8.2–1.2 meV and E2 = ∼60 meV at various Iex. We interpret E1 as a thermal activation energy that comes from Anderson localization, associated with roughness due to As2 diffusion into the interfaces. This is because the extracted E1 values are comparable to the exciton binding energy of localization in various quantum structures. Carrier trapping at a state in the InSb interfacial layer (Tamm state) may account for the origin of E2. Based on previous reports, we believe that the 60 meV state might be a Tamm state if we consider thickness variations in the InSb interfacial layer for the T2SLs.

The structural and reflectance properties of large gallium (Ga) droplets and GaAs islands grown by droplet epitaxy (DE) were presented. The reflectance results of self-assembled large GaAs islands by DE suggest the possibility of a novel method for antireflective coating. The diameter, height, density, and aspect ratio of large Ga droplets were investigated up to the scale of optical size. After GaAs island growth, the reflectance of s-polarization at 70° on in-situ measurement was reduced up to approximately 2%–20% in the wavelength range of 350–900 nm. For large GaAs islands, reduction of reflectance for s-, p-polarization at 20°–80° and reduction of reflectance at normal incidence was presented. This result shows that a layer of self-assembled large GaAs islands by DE can be a good candidate for an antireflector for high-quality optoelectronic devices.

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The effect of localized electric field (F ) was investigated in the type-II InAs/GaAsSb/GaAs structures. To compare type-I to type-II, two types of samples with different Sb contents was grown by molecular beam epitaxy, whose Sb contents are 3% (type-I) and 16% (type-II), respectively. In the both samples, we performed excitation power dependent-photoreflectance at 10 K and the result showed that the period of the Franz-Keldysh oscillation, revealed above the band gap (Eg) of GaAs, was broadened in the only type-II system, which means that F was also increased because it is proportional to the period of the Franz-Keldysh oscillation while the period of the Franz-Keldysh oscillations stayed unchanged in type-I system. This phenomenon is explained by that the F was affected by the band bending effect caused by the spatially separated photo-excited carriers in the interface between GaAsSb and GaAs. The F changed linearly as a function of square root of excitation power as expected for the F . Moreover, F was calculated using fast Fourier transform method for a qualitative analysis, which is in a good agreement with the theory of triangular well approximation.

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