Abstract-"eLine", a class of multichannel time-variant integrating front-end Application Specific Integrated Circuits (ASICs), has been completed at SLAC National Accelerator Laboratory for applications at the Linac Coherent Light Source (LCLS). The class, designed for pixelated sensors with columnparallel readout, is composed of two front-end ASICs: one designed for high-dynamic range applications (eLine10k) and one designed for ultra-low noise applications (eLine100). The first allows large input full-scale signals, on the order of 10 4 8keV photons, with a resolution of half a photon FWHM; while the second provides low noise charge integration, up to a full-scale signal of 100 8keV photons, with an equivalent noise charge (ENC) of 55e-r.m.s. Three different prototype systems utilizing the ASICs are described. The first is a 32k-pixel X-ray Active Matrix Pixel Sensor (XAMPS) detector developed at Brookhaven National Laboratory (BNL) for the X-ray Pump Probe instrument (XPP) at LCLS. The XAMPS are monolithic detectors with fast-frame readout and large full-scale signal. In particular, they provide a full well capacity on the order of 10 4 8keV photons per pixel and a resolution of half a photon FWHM. The second prototype, developed around eLine10k, is a beam finder with high dynamic range. The third prototype is developed around eLine100 to be used as detector in a spectrometer. Applications, test results and performance are discussed.
Electronic components used in high energy physics experiments are subjected to a radiation background composed of high energy hadrons, mesons and photons. These particles can induce permanent and transient effects that affect the normal device operation. Ionizing dose and displacement damage can cause chronic damage which disable the device permanently. Transient effects or single event effects are in general recoverable with time intervals that depend on the nature of the failure. The magnitude of these effects is technology dependent with feature size being one of the key parameters. Analog to digital converters are components that are frequently used in detector front end electronics, generally placed as close as possible to the sensing elements to maximize signal fidelity. We report on radiation effects tests conducted on 17 commercially available analog to digital converters and extensive single event effect measurements on specific twelve and fourteen bit ADCs that presented high tolerance to ionizing dose. Mitigation strategies for single event effects (SEE) are discussed for their use in the large hadron collider environment.
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