2015
DOI: 10.1088/1748-0221/10/08/p08009
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Evaluation of commercial ADC radiation tolerance for accelerator experiments

Abstract: Electronic components used in high energy physics experiments are subjected to a radiation background composed of high energy hadrons, mesons and photons. These particles can induce permanent and transient effects that affect the normal device operation. Ionizing dose and displacement damage can cause chronic damage which disable the device permanently. Transient effects or single event effects are in general recoverable with time intervals that depend on the nature of the failure. The magnitude of these effec… Show more

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Cited by 13 publications
(12 citation statements)
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References 19 publications
(31 reference statements)
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“…In addition, the device could no longer work after being irradiated for about 110 kRad(Si). This result is similar to previous TID test results [9] of ADCs from Analog Devices.…”
Section: Test Resultssupporting
confidence: 91%
“…In addition, the device could no longer work after being irradiated for about 110 kRad(Si). This result is similar to previous TID test results [9] of ADCs from Analog Devices.…”
Section: Test Resultssupporting
confidence: 91%
“…Each Nevis ADC has four analog channels. The other two types are Commercial-Off-The-Shelf (COTS) ADCs, ADS5272 and ADS5294, both produced by Texas Instruments [13]. Both COTS ADCs have eight analog channels.…”
Section: Introductionmentioning
confidence: 99%
“…LOCx2-130 supports three types of ADCs, an ASIC called Nevis ADCs [13] and two Commercial-Off-The-Shelf (COTS) devices (part numbers ADS5272 [14] and ADS5294 [15] produced by Texas Instruments). The input data of each channel of LOCx2-130 come from two Nevis ADCs, one ADS5272, or one ADS5294.…”
Section: Design Of Locx2-130mentioning
confidence: 99%