We use time-resolved magneto-optic Kerr effect (TR-MOKE) and ultrathin Co/Pt transducer films to perform thermal transport experiments with higher sensitivity and greater time resolution than typically available in studies of interfacial thermal transport by time-domain thermoreflectance (TDTR). We measure the interface conductance between Pt and amorphous SiO 2 using Pt/Co/Pt ferromagnetic transducer films with thicknesses between 4.2 nm and 8.2 nm and find an average value of G Pt ≈ 0.3 GW m −2 K −1 . This result demonstrates that interfaces between metals and amorphous dielectrics can have a conductance corresponding to Kapitza lengths of the order of 4 nm, and are thus of relevance when engineering nanoscale devices. For thin SiO 2 layers our method also provides sensitivity to the interface conductance between SiO 2 and Si and we find G Si ≥ 0.6 GW m −2 K −1 as the lower limit.
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