We report on a new coarse tip distance adjustment and positioner for a scanning tunneling microscope, which was designed with ease of sample manipulation and UHV compatibility in mind. It has no mechanical connections in UHV and has been successfully used for measurements of microfaceted platinum surfaces in air and cleaved Si(111) surfaces under liquids.
By using the scanning tunneling microscope we have determined the probability distribution for the distances between steps on the Cu (100) Step-step interactions enter third-and higher-order terms
Crystalline Si surfaces have been investigated in air with a fast operating scanning tunneling microscope. Pronounced atomic terrace and step structures have been observed on freshly prepared Si(100) surfaces. Displacements and changes in these structures during the scanning procedure have been recorded. The observed structures are attributed to water films on the surface.
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