The drive-level capacitance profiling technique has been applied to ZnO/CdS/CuIn1−xGaxSe2/Mo solar cell devices, in order to study properties of defects in the CuIn1−xGaxSe2 film. Properties studied include the spatial uniformity, bulk defect response, carrier density, and light-induced metastable effects. These results indicate that previous estimates of carrier densities, from C–V profiling, may be significantly overestimated. In addition, a defect response previously thought to be located at the interface is observed to exist throughout the bulk material. Finally, an infrared light-soaking treatment is demonstrated to induce metastable changes in the bulk CuIn1−xGaxSe2 film. Hence, the drive-level capacitance profiling technique provides valuable insights into these films. Herein, the technique itself is fully explained, compared to other junction capacitance methods, and its utility is demonstrated using numerical simulation.

Admittance spectra and drive-level-capacitance profiles of several high performance Cu2ZnSn(Se,S)4 (CZTSSe) solar cells with bandgap ∼1.0–1.5 eV are reported. In contrast to the case for Cu(In,Ga)(S,Se)2, the CZTSSe capacitance spectra exhibit a dielectric freeze out to the geometric capacitance plateau at moderately low frequencies and intermediate temperatures (120–200 K). These spectra reveal important information regarding the bulk properties of the CZTSSe films, such as the dielectric constant and a dominant acceptor with energy level of 0.13–0.2 eV depending on the bandgap. This deep acceptor leads to a carrier freeze out effect that quenches the CZTSSe fill factor and efficiency at low temperatures.

Defects in the band gap of CuIn1−xGaxSe2 have been characterized using transient photocapacitance spectroscopy. The measured spectra clearly show response from a band of defects centered around 0.8 eV from the valence band edge as well as an exponential distribution of band tail states. Despite Ga contents ranging from Ga/(In+Ga)=0.0 to 0.8, the defect bandwidth and its position relative to the valence band remain constant. This defect band may act as an important recombination center, contributing to the decrease in device efficiency with increasing Ga content.

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High-hydrogen-diluted films of hydrogenated amorphous Si (a-Si:H) 0.5 μm in thickness and optimized for solar cell efficiency and stability, are found to be partially microcrystalline (μc) if deposited directly on stainless steel (SS) substrates but are fully amorphous if a thin n layer of a-Si:H or μc-Si:H is first deposited on the SS. In these latter cases, partial microcrystallinity develops as the films are grown thicker (1.5–2.5 μm) and this is accompanied by sharp drops in solar cell open circuit voltage. For the fully amorphous films, x-ray diffraction (XRD) shows improved medium-range order compared to undiluted films and this correlates with better light stability. Capacitance profiling shows a decrease in deep defect density as growth proceeds further from the substrate, consistent with the XRD evidence of improved order for thicker films.

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Recent studies of selective attention in schizophrenia patients suggest a particular pattern of single-trial Stroop performance: increased facilitation but not interference in reaction times (RTs), combined with increased error interference. Our Stroop task analysis suggests that this pattern can be explained by a selective attention deficit if one accounts for (1) performance in the congruent condition; (2) the nature of the neutral stimulus; (3) the relationship between accuracy and RT; and (4) response set effects. To test these hypotheses, we examined Stroop performance in 40 DSM-IV schizophrenia patients and 20 healthy control subjects, using a range of neutral stimuli (color patches, noncolor words, color words not in the response set). The findings confirmed several of our predictions and the results were consistent with the hypothesis that abnormal Stroop performance in schizophrenia reflects a failure to adequately attend to the task-appropriate stimulus dimension (color). This inattention affects both the congruent and incongruent conditions and multiple points in the information processing pathway.

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