Partial erasure of track edges was directly measured from triple-track patterns using a novel model to interpret the output profiles. The model is based on representing the read head as the sum of a reference width, wavelength independent, and two side reading effective widths that are wavelength dependent. We applied this technique to measure erase bands and side read widths of an advanced helical scan silicon head with 3.5-m pole width, in combination with metal particle tape with coercivity = 135 kA/m. The good pole alignment of the head minimizes side effects and we report an erase band of 0.3 m for a 0.5-m wavelength track overwriting the edge of a track having the same wavelength.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.