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A simple fast test generation algorithm by using the notion of M-difference is given for rn-logic combinational circuits (i.e. circuits which realize m-valued logic functions, rn 2 2). Without losing any generality, the proposed algorithm is defined only lor the case of primary input s-a-fault model. A corresponding proof of the algorithm is shown and several examples are given. Moreover a simplified version for m = 2 is illustrated. The above algorithms may be considered as some random (input space search) procedures and realized in a parallel way (e.g. by using a high speed modern supercomputer).

Abstract. The subject of this paper is the theory of fault distinguishable discrete event systems. Any such system is modelled by a live, bounded, and reversible place-transition net. The notions of D-partition of the set of places P of a given place-transition net N and net k-distinguishability are first introduced. The system k-distinguishability measure is obtained in a unique way from the placeinvariant matrix. For a large value of k, the system model is extended by using some set of additional places called test points. It is shown that the test point placement process will not change the above-assumed original net properties. Several examples are given.

A multi-valued algebraic system by using the notion of M-algebra is introduced. The system, called D-algebra, is represented as an isomorphic image of the direct product of two M-algebras. Next this D-algebra is used to generate tests for mlogic combinational circuits (i.e. circuits which realize m-valued logic functions, m22). The test generation is a fault oriented process (tests are derived for specific faults). This process is illustrated by means of an informal modification of the classical Roth D-algorithm (a more formal treatment is omitted). For simplicity, only the s-a-fault model is considered and several examples are given.

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