Abstract:In this paper, a theory on the determination of the diffusion coefficient of the excess minority carriers of a silicon solar cell is presented. The expression of the diffusion coefficient, related to the modulation frequency, the irradiation energy and the damage coefficient is studied and then performed by using the impedance spectroscopy method and Bode and Nyquist diagrams. Based on the diffusion coefficient, we deduce the diffusion length, the cutoff frequency and some electrical parameters obtained from the equivalent circuits of the diffusion coefficient.
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