Multiferroic BiCr x Fe 1-x O 3 (BCFO) (0 B x B 0.12) thin films were fabricated on silicon substrates by sol-gel technique. The microstructure and properties of the films are characterized using X-ray diffraction, spectroscopic ellipsometry, micro-Raman spectrometry and a Modular Control system. The BCFO films are the rhombohedral structure with the Cr content up to 7%. Raman scattering spectra of the BCFO films demonstrate the transformation of structure with the Cr content exceeding 10%. The band gap of the BCFO films is from 2.53 to 2.82 eV with the Cr content being from 0 to 12%. The magnetization of the BCFO films is significantly enhanced with the increasing of the Cr content.
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