The spin transfer torque is essential for electrical magnetization switching. When a magnetic domain wall is driven by an electric current through an adiabatic spin torque, the theory predicts a threshold current even for a perfect wire without any extrinsic pinning. The experimental confirmation of this 'intrinsic pinning', however, has long been missing. Here, we give evidence that this intrinsic pinning determines the threshold, and thus that the adiabatic spin torque dominates the domain wall motion in a perpendicularly magnetized Co/Ni nanowire. The intrinsic nature manifests itself both in the field-independent threshold current and in the presence of its minimum on tuning the wire width. The demonstrated domain wall motion purely due to the adiabatic spin torque will serve to achieve robust operation and low energy consumption in spintronic devices.

It was found that high current density needed for the current-driven domain wall motion results in the Joule heating of the sample. The sample temperature, when the current-driven domain wall motion occurred, was estimated by measuring the sample resistance during the application of a pulsed-current. The sample temperature was 750 K for the threshold current density of 6.7 x 10^11 A/m2 in a 10 nm-thick Ni81Fe19 wire with a width of 240 nm. The temperature was raised to 830 K for the current density of 7.5 x 10^11 A/m2, which is very close to the Curie temperature of bulk Ni81Fe19. When the current density exceeded 7.5 x 10^11 A/m2, an appearance of a multi-domain structure in the wire was observed by magnetic force microscopy, suggesting that the sample temperature exceeded the Curie temperature.Comment: 13 pages, 4 figure

All-electrical control and local detection of multiple magnetic domain walls in perpendicularly magnetized Co/Ni nano-wires were demonstrated. A series of domain walls was reproducibly shifted in the same direction by the current, keeping the distance between the walls almost the same. Furthermore, the walls can be shifted back and forth depending on the direction of the pulsed currents.

The authors show experimental results on domain wall motion induced by electric current in a Co/Ni nano-wire with perpendicular magnetic anisotropy. The motion was detected electrically by using the anomalous Hall effect. Threshold current density for the domain wall motion was found to decrease with decreasing the wire width, where the minimum threshold current density of approximately 5×1011 A/m2 was observed for the wire width of 70 nm.

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We report the direct observation of the current-driven domain wall (DW) motion by magnetic force microscopy in a structured Co/Ni wire with perpendicular magnetic anisotropy. The wire has notches to define the DW position. It is demonstrated that single current pulses can precisely control the DW position from notch to notch with high DW velocity of 40 m/s.

This paper presents two novel measurement methods to characterize silicon carbide (SiC) MOSFET devices. The resulting data are utilized to significantly improve the extraction of a custom device model that can now accurately reproduce device switching behavior. First, we consider the I d −V ds output characteristics of power devices such as SiC transistors. These are typically measured using traditional curve tracers, but the characterization of the high-voltage and high-current (HVHC) region is very challenging because of device power compliance and self-heating. In this paper, we introduce a measurement technique that overcomes self-heating and derives the HVHC region from switching waveforms. The switching transient characteristics of devices are used to determine drain current (I d ) as a function of drain-source voltage (V ds ) in the HVHC range. Second, we consider another challenging characterization area: measurement of nonlinear capacitances when device is turned on. These capacitance characteristics of on-state devices are important for correcting disagreements between simulations and measurements in turn-off switching transient waveforms and cannot be measured using a conventional capacitance-voltage meter. We introduce S-parameter measurements as an effective method to obtain the capacitance characteristics of both off-state devices and on-state devices. These novel measurement techniques have been applied to the modeling of a SiC device. The extracted device model, a modified version of the popular Angelov−GaN high-electron-mobility transistor model, shows significant improvement in terms of the accuracy of switching waveforms of devices over a wide range of operating conditions.

We report a systematic study of the DW motion in perpendicularly magnetized Co/Ni nanowires having different thicknesses with structure inversion asymmetry. The transition from bulk to interfacial effects is confirmed as a change in the DW motion direction at a reduced layer thickness. The bias field dependence reveals that the adiabatic spin transfer torque (STT) dominates the DW motion in the thick regime, whereas the interfacial torque originating from the spin Hall effect (SHE) is responsible for the DW motion with a fixed DW chirality induced by the Dzyaloshinskii–Moriya interaction (DMI) in the thin regime.