A Josephson junction defect spectrometer for measuring two-level systems Appl. Phys. Lett. 101, 062602 (2012) Resistive switching by migration of hydrogen ions Appl. Phys. Lett. 101, 043507 (2012) Nonlinear induction detection of electron spin resonance Appl. Phys. Lett. 101, 022602 (2012) Identifying capacitive and inductive loss in lumped element superconducting hybrid titanium nitride/aluminum resonators Appl.
A dc electron beam at 20 keV is used for the excitation of pure rare gases at pressures up to 1.7 bar. The well known second excimer continua of argon, krypton, and xenon observed under these excitation conditions provide an efficient light source in the vacuum ultraviolet spectral region between 120 and 200 nm. Thin (300 nm) SiNx foils are used as entrance windows for the low energy electron beam. Due to the flexibility of the production process of the thin foils one can consider various shapes and sizes of the light emitting region to be manufactured. Efficiencies of ∼30% are observed for the conversion of electron beam energy into light.
Publication costs assisted by the IBM CorporationThe refractive indices, density, and diamagnetic susceptibility are reported as a function of temperature for three materials that exhibit nematic liquid crystalline phases in the vicinity of room temperature.The temperature dependence of the nematic order parameter is essentially identical for the three materials. The applicability of models used in the computation of polarization fields of anisotropic molecules is evaluated.
Using micro-fabrication techniques, we have manufactured a single element kinoform lens in single-crystal silicon with an elliptical profile for 12.398 keV (1A) x-rays. By fabricating a lens that is optimized at fixed wavelengths, absorption in the lens material can be significantly reduced by removing 2_ phase-shifting regions. This permits short focal length devices to be fabricated with small radii of curvatures at the lens apex. This feature allows one to obtain a high demagnification of a finite synchrotron electron source size. The reduced absorption loss also enables optics with a larger aperture, and hence improved resolution for focusing and imaging applications. Our first trial of these lenses has resulted in a one micron line focus (fwhm) at the National Synchrotron Light Source X13B beamline.
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