A study of the temperature dependence of the electrical resistivity of rolled potassium films is reported for the temperature range 4.2 -17.4 K. The thickness of the samples was between 3.4 and 69.0 pm, which is comparable to the mean free path of the electronic motion for the pure bulk potassium. This implies the appearance of size eFects in the electrical resistivity. The study covered the region for which the temperature dependence of the electrical resistivity is due to the electronphonon umklapp scattering process, and can be described by the expression (T/oj"exp( -8/T).The exponent n of the prefactor in'the electron-phonon scattering term showed a linear increase as a function of the reciprocal of the film thickness, 1/d, when the parameter 0 was kept constant. A corresponding linear increase in 0 as a function of 1/d was observed when the fitting was done with a constant value of n. From the comparison with the available theoretical analysis for the bulk case, we find that the interrelation between the n and 0 parameters is readily established for thin potassium films.
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