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The use of direct-patternable lead zirconate titanate (PZT) films produced using photosensitive stock solutions with ortho-nitrobenzaldehyde and UV (365 nm) irradiation has reached an advanced stage of application in microdetection systems. Electromechanical properties of direct patterned PZT microcantilevers on SiNx∕Ta∕Pt∕PZT∕Pt∕SiO2 structure were measured by a laser vibrometer system as a function of cantilever length. The gravimetric sensitivity of cantilevers in air was characterized by Au deposition, and the mass detecting resolution was 38Hz∕ng. These results suggested a possibility that microelectromechanical systems may be fabricated relatively easily and without high cost processes, for example, by PZT dry etching.

Direct-patternable lead zirconate titanate (PZT) film was prepared by sol-gel technique using orthnitrobenzaldehyde as a photosensitive agent. For applying this direct-patternable PZT ferroelectric film to micro electromechanical system, a development of stress in the film was investigated by modifying the anneal condition and the constituents of PZT sol. The residual stress in the conventional and modified (for stress-release) direct-patternable PZT films was investigated by the Raman spectroscopy. In addition, ferroelectric properties of modified PZT film were compared with those of conventional film. Finally, we assess the applying feasibility of direct-patternable PZT film to microdetecting system.