The Highly Accelerated Robustness Test, HART, is an approach that allows the assessment or the robustness of adhesive interconnects at a throughput rate that is 10 times faster than the conventional accelerated humidity test, without going to higher stress levels. The test is based on the physics of a conductive adhesive interconnect. In stead of using the contact resistance drift over time in a static temperaturehumidity environment, HART uses the effect of a changing temperature or humidity environment on the contact resistance as a characteristic of the robustness of the interconnect. HART using moisture as stressor is by far the most powerful approach of the two. Both the response and hysteresis in a cyclic humidity environment are proposed as new criteria for the interconnect robustness. Flip chip on flex interconnections with conductive and non-conductive adhesives are used as a carrier. Different contact material combinations and different adhesives are used in this study.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.