A systematic analysis of the deep level spectrum in the lower half of the bandgap of Au–Zn1−xMgxO (0.056<x<0.18) Schottky diodes is presented. Two deep levels are observed at Ev+580 and Ev+280 meV regardless of the bandgap energy with trap concentrations linearly increasing with the Mg content. The Ev+280 meV trap concentration becomes as high as 1.01×1018 cm−3 at 18% Mg, partially compensating the films and causing a decrease from 8.02×1016 to 1.27×1016 cm−3 in the net electron concentration and an increase by three orders of magnitude in the diode series resistance due to electron trapping.

Schottky photodiodes based on Au-ZnMgO/sapphire are demonstrated covering the spectral region from 3.35 to 3.48 eV, with UV/VIS rejection ratios up to ∼105 and responsivities as high as 185 A/W. Both the rejection ratio and the responsivity are shown to be largely enhanced by the presence of an internal gain mechanism, by which the compensated films become highly conductive as a result of illumination. This causes a large increase in the tunnel current through the Schottky barrier, yielding internal gains that are a function of the incident photon flux.

High quality 1 \im thick a-plane Mg^Zn^^O layers were produced by molecular beam epitaxy with Mg contents higher than 50%. Resonant Rutherford backscattering spectrometry combined with ion channeling revealed a uniform growth in both composition and atomic order. The lattice-site location of Mg, Zn and O elements was determined independently, proving the substitutional behavior of Mg in Zn-sites of the wurtzite lattice. X-Ray diffraction pole figure analysis also confirms the absence of phase separation. Optical properties at such high Mg contents were studied in Schottky photodiodes.

Light polarization-sensitive UV photodetectors (PSPDs) using non-polar a-plane ZnMgO/ZnO multiple quantum wells grown both on sapphire and ZnO substrates have been demonstrated. For the PSPDs grown on sapphire with anisotropic biaxial in-plain strain, the responsivity absorption edge shifts by ΔE ∼ 21 meV between light polarized perpendicular (⊥) and parallel (||) to the c-axis, and the maximum responsivity (R) contrast is (R⊥/R||)max ∼ 6. For the PSPDs grown on ZnO, with strain-free quantum wells, ΔE ∼ 40 meV and (R⊥/R||)max ∼ 5. These light polarization sensitivities have been explained in terms of the excitonic transitions between the conduction and the three valence bands.

This work presents a comprehensive optical characterization of Zn 1 _ x Mg x O thin films grown by spray pyrolysis (SP). Absorption measurements show the high potential of this technique to tune the bandgap from 3.30 to 4.11 eV by changing the Mg acetate content in the precursor solution, leading to a change of the Mg-content ranging from 0 up to 35%, as measured by transmission electron microscopy-energy dispersive x-ray spectroscopy. The optical emission of the films obtained by cathodoluminescence and photoluminescence spectroscopy shows a blue shift of the peak position from 3.26 to 3.89 eV with increasing Mg incorporation, with a clear excitonic contribution even at high Mg contents. The linewidth broadening of the absorption and emission spectra as well as the magnitude of the observed Stokes shift are found to significantly increase with the Mg content. This is shown to be related to both potential fluctuations induced by pure statistical alloy disorder and the presence of a tail of band states, the latter dominating for medium Mg contents. Finally, metal-semiconductor-metal photodiodes were fabricated showing a high sensitivity and a blue shift in the cut-off energy from 3.32 to 4.02 eV, i.e., down to 308 nm. The photodiodes present large UV/dark contrast ratios (10 -10 7 ), indicating the viability of SP as a growth technique to fabricate low cost (Zn, Mg)0-based UV photodetectors reaching short wavelengths.