Modern packaging design requires extensive signal integrity simulations in order to assess the electrical performance of the system. The feasibility of such simulations is granted only when accurate and efficient models are available for all system parts and components having a significant influence on the signals. Unfortunately, model derivation is still a challenging task, despite the extensive research that has been devoted to this topic. In fact, it is a common experience that modeling or simulation tasks sometimes fail, often without a clear understanding of the main reason. This paper presents the fundamental properties of causality, stability, and passivity that electrical interconnect models must satisfy in order to be physically consistent. All basic definitions are reviewed in time domain, Laplace domain, and frequency domain, and all significant interrelations between these properties are outlined. This background material is used to interpret several common situations where either model derivation or model use in a computer-aided design environment fails dramatically. We show that the root cause for these difficulties can always be traced back to the lack of stability, causality, or passivity in the data providing the structure characterization and/or in the model itself.

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This paper focuses on the derivation of an enhanced transmission-line model allowing for the stochastic analysis of a realistic multiconductor interconnect. The proposed model, that is based on the expansion of the well-known telegraph equations in terms of orthogonal polynomials, includes the variability of geometrical or material properties of the interconnect due to uncertainties like fabrication process or temperature. A real application example involving the frequency-domain analysis of a coupled microstrip and the computation of the parameters variability effects on the transmission-line response concludes the paper.

This paper addresses the development of macromodels for input and output ports of a digital device. The proposed macromodels consist of parametric representations that can be obtained from port transient waveforms at the device ports via a well established procedure. The models are implementable as SPICE subcircuits and their accuracy and efficiency are verified by applying the approach to the characterization of transistor-level models of commercial devices.

This paper is devoted to transient analysis of lossy transmission lines characterized by frequency-dependent parameters. A public dataset of parameters for three line examples (a module, a board, and a cable) is used, and a new example of on-chip interconnect is introduced. This dataset provides a well established and realistic benchmark for accuracy and timing analysis of interconnect analysis tools. Particular attention is devoted to the intrinsic consistency and causality of these parameters. Several implementations based on generalizations of the well-known method-of-characteristics are presented. The key feature of such techniques is the extraction of the line modal delays. Therefore, the method is highly optimized for long interconnects characterized by significant propagation delay. Nonetheless, the method is also successfully applied here to a short high/loss on-chip line, for which other approaches based on lumped matrix rational approximations can also be used with high efficiency. This paper shows that the efficiency of delay extraction techniques is strongly dependent on the particular circuit implementation and several practical issues including generation of rational approximations and time step control are discussed in detail.