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In traditional imaging system design, the optical lens is often optimized toward the artificial optimization target like modulation transfer function and field-of-view (FoV). This usually leads to complex stacks of lenses. In order to reduce the complexity, we propose an end-to-end single lens imaging system design method. First, the imaging and processing model is established, whose input end is the ground truth image, and the output end is the restored image by Res-Unet. Then, with the optimization target of minimizing the difference between the restored image and the ground truth image, the parameters of the lens surface and the parameters of the restoration algorithm are optimized simultaneously by deep learning. In order to realize the end-to-end design, the imaging model is required to be differentiable to the lens parameters, so a fast differentiable ray tracing model is proposed. A single lens imaging system with high-quality large FoV (47°) has been designed by the end-to-end method. This method will have a wide application prospects in the design of light and small optoelectronic imaging systems.

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The surface of a complex material with a periodic structure is equivalent to the surface of a uniform material, and the measurement and data processing methods for the equivalent optical BRDF of a solar panel based on a large-scale spot are proposed. Based on a solar simulator, high-intensity light illuminometer, low-intensity light illuminometer and precise rotary platform, the BRDF automatic measurement platform is built. Spot size optimization and a measurement radius optimization method are proposed. The measurement results show that the BRDF of the solar panel has specular reflection characteristics, but that it still differs from the solar cell in the half width of the BRDF curve. Measurement error analysis is performed for the measurement process; its value is 6.74%. The measurement results can be used to improve the understanding of the optical reflection characteristics of the solar panel. Meanwhile, the method can also be used to measure and characterize the coatings of heat insulation material and scattering coating. The measurement data also has practical reference value for evaluations of improvements of the light absorption of the surface functional material. Finally, it can be used to simulate the target image scene.