Data reduction practice in X-ray reflectometry is described. The several approaches for applying certain corrections, such as background subtraction, geometrical effects and normalization, are compared and discussed. Two widely employed setups, one with beam knife-edge and one without, are compared with respect to a number of corrections to be applied.
Data analysis methods for specular X-ray or neutron reflectivity are compared. The methods that have been developed over the years can be classified into different types. The so-called classical methods are based on Parrat's or Abelè s' formalism and rely on minimization using more or less evolved Levenberg-Marquardt or simplex routines. A second class uses the same formalism, but optimization is carried out using simulated annealing or genetic algorithms. A third class uses alternative expressions for the reflectivity, such as the Born approximation or distorted Born approximation. This makes it easier to invert the specular data directly, coupled or not with classical least-squares or iterative methods using over-relaxation or charge-flipping techniques. A fourth class uses mathematical methods founded in scattering theory to determine the phase of the scattered waves, but has to be coupled in certain cases with (magnetic) reference layers. The strengths and weaknesses of a number of these methods are evaluated using simulated and experimental data. It is shown that genetic algorithms are by far superior to traditional and advanced least-squares methods, but that they fail when the layers are less well defined. In the latter case, the methods from the third or fourth class are the better choice, because they permit at least a first estimate of the density profile to be obtained that can be refined using the classical methods of the first class. It is also shown that different analysis programs may calculate different reflectivities for a similar chemical system. One reason for this is that the representation of the layers is either described by chemical composition or by scattering length or electronic densities, between which the conversion of the absorptive part is not straightforward. A second important reason is that routines that describe the convolution with the instrumental resolution function are not identical. research papers J. Appl. Cryst. (2007). 40, 820-833 A. van der Lee et al. Data analysis of specular reflectivity data 821 research papers J. Appl. Cryst. (2007). 40, 820-833 A. van der Lee et al. Data analysis of specular reflectivity data 823
Commercial membranes suitable for solid alkaline membrane fuel cell (SAMFC) have not proved their competitiveness yet, due to poor ionic conductivity and water and fuel retention. Plasma polymers are however promising candidates to meet the SAMFC requirements. In this work, X‐ray reflectometry has been used to determine the thickness, density and water swelling of plasma polymerized films prepared from triallylamine, leading to a bilayer model for the studied thin films. Both film density and water swelling show a bimodal evolution as a function of the average plasma discharge power, which is directly related to the precursor fragmentation mechanism in the plasma phase and can be correlated with the film chemical composition.
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