X-ray difraction (XRD) is an effective non-destructive instrument used in the determination and analysis of amorphous and crystalline materials. Three basic elements are the X-ray diffractometers: the X-ray tube, a retention of samples and an X-ray detector. In many industries such as diodes, transistors, detectors, solar and photovoltaic cells, cadmium oxide CdO nanoparticles are used. For this analysis, CdO nanoparticles are semi-conductors (type) and band-gaps of 2.5 eV and 1.98 eV in direct and indirect bands using cadmium oxide. Several temperatures, effects and parameters such as texture coefficient (TC), dislocation density(μ), special area (SSA), and micro strain were measured and determined (S). The peaks of the analysis were the extension of the nano structure, crystal size and grid pressure of the CdO and were measured using the Size Train Plot of Williamson-Hall (SSP). The composition of the particle is the cubic fluorite and spatial group Fm-3m (225). In the peaks resulting from the calcination process, strain enlargement was observed. Accordingly, the above procedure determined all physical parameters as a result of the diffraction effects.
The zinc oxide (ZnO) - copper oxide (CuO) n-p junctions are a promising material for detecting ammonia gas. In this work, nanocomposite of ZnO: CuO thin films were deposited by using sol-gel spin coating method on a glass substrate. The search aimed to study the effect of annealing at 500oC on the physical properties and the effect of annealing on the sensing properties of the prepared films. The characterization of thin films before and after annealing treatment was studied by X-ray diffraction (XRD), atomic force microscopy (AFM), and scanning electron microscopy (SEM) for the morphology of the surface and grain size of particles also, UV-Visible analysis for optical properties. Sensing properties were also studied before and after annealing. The results showed the films were polycrystalline in nature with a monoclinic phase and the crystalline size was 5.4 nm and 9.9 nm before and after annealing. The results of SEM and AFM showed the surface uniformly and particle size was 25nm to 32 nm before and after annealing. The results of sensing properties for ammonia gas showed the sensitivity was enhancement after annealing treatment.
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