A comparative study of the method of Williamson Hall and the pattern of cadmium oxide nanoparticles for X-rays

Abstract

X-ray difraction (XRD) is an effective non-destructive instrument used in the determination and analysis of amorphous and crystalline materials. Three basic elements are the X-ray diffractometers: the X-ray tube, a retention of samples and an X-ray detector. In many industries such as diodes, transistors, detectors, solar and photovoltaic cells, cadmium oxide CdO nanoparticles are used. For this analysis, CdO nanoparticles are semi-conductors (type) and band-gaps of 2.5 eV and 1.98 eV in direct and indirect bands using cadmium oxide. Several temperatures, effects and parameters such as texture coefficient (TC), dislocation density(μ), special area (SSA), and micro strain were measured and determined (S). The peaks of the analysis were the extension of the nano structure, crystal size and grid pressure of the CdO and were measured using the Size Train Plot of Williamson-Hall (SSP). The composition of the particle is the cubic fluorite and spatial group Fm-3m (225). In the peaks resulting from the calcination process, strain enlargement was observed. Accordingly, the above procedure determined all physical parameters as a result of the diffraction effects.

Cadmium Sulfide Nanoparticles: Synthesis, Characterization, and Antimicrobial Study

“…The synthesized sample's d-spacing or interplanar spacing "d" was analyzed at different peak positions using Bragg's conditions [28].…”

Temperature Dependence on Structural Properties of Liquid Phase Synthesized ZnO

“…where D is the particle size in nm, k is a constant of value 0.9, λ is the X-ray wavelength in nm, θ is the Bragg's angle in radians, and β is the full width at half maximum of the peak in radians [12], [17], [23]. The dislocation density (δ), which is the number of defects in the sample is calculated using equation 8 [7], [8], [14], [24];…”

“…The specific surface area (Sa) was determined from particle size of the ZnO nanoparticles using equation 13 [3], [24]:…”

“…The observed trend in the dislocation density can be said to generally decrease as temperature increase irrespective of the rise in value at 200 °C. The decrease in the dislocation density signifies a decline in crystallography deformation, topological imperfection or irregularity [44], [24]. The lower values of dislocation density are attributed to the lower level of the defect and better crystalline quality of the ZnO sample at higher temperature.…”