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In Part II of this paper, a comparison of the most representative flip-flop (FF) classes and topologies in a 65-nm CMOS technology is carried out. The comparison, which is performed on the energy-delay-area domain, exploits the strategies and methodologies for FFs analysis and design reported in Part I. In particular, the analysis accounts for the impact of leakage and layout parasitics on the optimization of the circuits. The tradeoffs between leakage, area, clock load, delay, and other interesting properties are extensively discussed. The investigation permits to derive several considerations on each FF class and to identify the best topologies for a targeted application.

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SUMMARYIn this paper, the adoption of general metrics of the energy-delay tradeoff is investigated to achieve energyefficient design of digital CMOS very large-scale integrated circuits. Indeed, as shown in a preliminary analysis on the performance of various commercial microprocessors, a wide range of E i D j metrics is typically adopted. Physical interpretation and interesting properties for the designs minimizing E i D j metrics are provided together with the adoption of the Logical Effort theory to define practical design constraints. Two design examples in a 65-nm CMOS technology are also reported to exemplify the theoretical results.