Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance. In this paper we present the: first approach able to diagnose faulty programmable logic blocks (PLBs) in Field Programmable Gate Arrays (FPGAs) with maximal cliagnostic resolution. Our approach is basecl on a new Built-In SelfTest (BIST) architecture for FPGAs and can accurately locate any single and most multiple faulty l?LBs. An adaptive diagnostic strategy provides identification of faulty PLB!j with a 7% increase in testing time over the complete detect.ion test, and can also be used for manufacturing yield einhanlcement. We present results showing identification of faulty I'LBs in defective ORCA chips.' 1.Introducti.onAn FPGA consists of an array of programmable logic blocks (PLBs) interconnected by a programm,able routing network, and programmable U 0 cells. The set of all programming bits establishes a cnnjiguration which determines the function of the device. In this paper, we considler in-circuit reprogrammable FPGAs, such as SRAM-based FPGAs, which may be reconfigured an arbitrarily large: number of times. FPGA manufacturing tests are complicated by the need to cover all possible modes of operation of the PLBs and also to detect all the faults affecting the programmable interconnect network. Currently, thesje tests are generated manually by configuring several application circuits and exercising them with test patterns developed specifically for each application circuit. The FPGA manufacturing tiests are not reusable for board and system-level testing, which require separate development efforts that rely on system diagnostic routines to test the FPGAs in their system mode of operation.
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