We have observed strong room-temperature electroluminescence at 1.54 μm induced by erbium ions in amorphous hydrogenated silicon (a-Si:H). The device consisted of an Al/a-Si:H(Er)/n-c-Si/Al structure. A mechanism for electronic excitation of the erbium ions in the amorphous matrix is proposed that is based on defect-related Auger excitation.
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