Dual-wavelength holography has a better axial range than single-wavelength holography, allowing unambiguous phase imaging. Partial coherence sources reduce coherent noise, resulting in improved reconstructed images. We measured a ball-grid array using dual-wavelength holography with partial coherence sources. This holography method is useful for measurement samples that exhibit coherence noise and have a step height larger than the single wavelength used in holography.
In this paper we have applied self-reference hologram to DHM (digital holography microscopy) to remove phase aberration. We have constructed an off-axis reflection-type digital holography microscope. We have extracted a low spatial frequency hologram from the conjugated hologram and used it as a reference hologram. Experimentally we show that distortion of image and aberration of phase in a measurement system are removed using the self-reference hologram.
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