A novel design-for-testability approach is proposed, which is derived from the aggressive probabilistic targets set forth for the yield and quality to be achieved in the massproduction of high-volume low-cost transceiver SoCs, thus requiring solutions that are fundamentally different from the traditional approaches. Statistical analysis is presented as the basis for the proposed approach, and specific guidelines are defined and demonstrated through examples. The proposed approach, based on built-in-self-testing (BIST) of RF/mixedsignal functions in the transceiver SoC, relies on digital processing resources that are typically available within the SoC at no additional cost and may aid in its testing and calibration. The important roles of characterization and built-in-selfcalibration and compensation in this context are also defined.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.