Based on first-principles calculations, we study the structural stability of the H and T phases of monolayer MoS 2 upon Li doping. Our calculations demonstrate that it is possible to stabilize the T phase of MoS 2 over the H phase through adsorption of Li atoms on the MoS 2 surface. Through molecular dynamics and phonon calculations we show that the T phase of MoS 2 is dynamically unstable and undergoes considerable distortions. The type of distortion depends on the concentration of adsorbed Li atoms and changes from zigzag-like to diamond-like when increasing the Li doping. There exists a substantial energy barrier to transform the stable H phase to the distorted T phases which is considerably reduced by increasing the concentration of Li atoms. We show that it is necessary that the Li atoms adsorb on both sides of the MoS 2 monolayer to reduce the barrier sufficiently. Two processes are examined that allow for such twosided adsorption, namely penetration through the MoS 2 layer and diffusion over the MoS 2 surface. We show that while there is only a small barrier of 0.24 eV for surface diffusion, the amount of energy needed to pass through a pure MoS 2 layer is of the order of 2 eV. However, when the MoS 2 layer is covered with Li atoms the amount of energy that Li atoms should gain to penetrate the layer is drastically reduced and penetration becomes feasible.
The intrinsic field effect, the change in surface conductance with an applied transverse electric field, of prototypal strongly correlated VO(2) has remained elusive. Here we report its measurement enabled by epitaxial VO(2) and atomic layer deposited high-κ dielectrics. Oxygen migration, joule heating, and the linked field-induced phase transition are precluded. The field effect can be understood in terms of field-induced carriers with densities up to ∼5×10(13) cm(-2) which are trongly localized, as shown by their low, thermally activated mobility (∼1×10(-3) cm(2)/V s at 300 K). These carriers show behavior consistent with that of Holstein polarons and strongly impact the (opto)electronics of VO(2).
We have grown epitaxial Cr-doped V2O3 thin films with Cr concentrations between 0 and 20% on (0001)-Al2O3 by oxygen-assisted molecular beam epitaxy. For the highly doped samples (> 3%), a regular and monotonous increase of the resistance with decreasing temperature is measured. Strikingly, in the low doping samples (between 1% and 3%), a collapse of the insulating state is observed with a reduction of the low temperature resistivity by up to 5 orders of magnitude. A vacuum annealing at high temperature of the films recovers the low temperature insulating state for doping levels below 3% and increases the room temperature resistivity towards the values of Cr-doped V2O3 single crystals. It is well-know that oxygen excess stabilizes a metallic state in V2O3 single crystals. Hence, we propose that Cr doping promotes oxygen excess in our films during deposition, leading to the collapse of the low temperature (LT) insulating state at low Cr concentrations. These results suggest that slightly Cr-doped V2O3 films can be interesting candidates for field effect devices.
Simulations are carried out based on the dynamical mean-field theory (DMFT) in order to investigate the properties of correlated thin films for various values of the chemical potential, temperature, interaction strength, and applied transverse electric field. Application of a sufficiently strong field to a thin film at half-filling leads to the appearance of conducting regions near the surfaces of the film, whereas in doped slabs the application of a field leads to a conductivity enhancement on one side of the film and a gradual transition to the insulating state on the opposite side. In addition to the inhomogeneous DMFT, an independent layer approximation (ILA) is considered, in which the properties of each layer are approximated by a homogeneous bulk environment. A comparison between the two approaches reveals that the less expensive ILA results are in good agreement with the DMFT approach, except close to the metal-to-insulator transition points and in the layers immediately at the film surfaces. The hysteretic behavior (memory effect) characteristic of the bulk doping driven Mott transition persists in the slab.
The ground state properties of a paramagnetic Mott insulator are investigated in the presence of an external electrical field using the inhomogeneous Gutzwiller approximation for a single band Hubbard model in a slab geometry. The metal insulator transition is shifted towards higher Hubbard repulsions by applying an electric field perpendicular to the slab. The spatial distribution of site dependent quasiparticle weight shows that the quasiparticle weight is maximum in few layers beneath the surface. Moreover only at higher Hubbard repulsion, larger than the bulk critical U, the electric field will be totally screened only for centeral cites. Our results show that by presence of an electric field perpendicular to a thin film made of a strongly correlated material, states near the surface will remain metallic while the bulk becomes insulating after some critical U. In contrast, in the absence of the electric field the surface becomes insulating before the bulk.
We study the effects of Kohn anomalies on the superconducting properties in electron- and hole-doped cases of monolayer blue phosphorene, considering both adiabatic and non-adiabatic phonon dispersions using first-principle calculations. We show that the topology of the Fermi surface is crucial for the formation of Kohn anomalies of doped blue phosphorene. By using the anisotropic Eliashberg formalism, we further carefully consider the temperature dependence of the non-adiabatic phonon dispersions. In cases of low hole densities, strong electron-phonon coupling leads to a maximum critical temperature of Tc = 97 K for superconductivity. In electron-doped regimes, on the other hand, a maximum superconducting critical temperature of Tc = 38 K is reached at a doping level that includes a Lifshitz transition point. Furthermore, our results indicate that the most prominent component of electron-phonon coupling arises from the coupling between an in-plane (out-of-plane) deformation and in-plane (out-of-plane) electronic states of the electron (hole) type doping.
Surface effects of a doped thin film made of a strongly correlated material are investigated both in the absence and presence of a perpendicular electric field. We use an inhomogeneous Gutzwiller approximation for a single band Hubbard model in order to describe correlation effects. For low doping, the bulk value of the quasiparticle weight is recovered exponentially deep into the slab, but with increasing doping, additional Friedel oscillations appear near the surface. We show that the inverse correlation length has a power-law dependence on the doping level. In the presence of an electrical field, considerable changes in the quasiparticle weight can be realized throughout the system. We observe a large difference (as large as five orders of magnitude) in the quasiparticle weight near the opposite sides of the slab. This effect can be significant in switching devices that use the surface states for transport.
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