Cohesive Hamaker constants of solid materials are measured via optical and dielectric properties (i.e., Lifshitz theory), inverse gas chromatography (IGC), and contact angle measurements. To date, however, a comparison across these measurement techniques for common energetic materials has not been reported. This has been due to the inability of the community to produce samples of energetic materials that are readily compatible with contact angle measurements. Here we overcome this limitation by using physical vapor deposition to produce thin films of five common energetic materials, and the contact angle measurement approach is applied to estimate the cohesive Hamaker constants and surface energy components of the materials. The cohesive Hamaker constants range from 85zJ to 135zJ across the different films. When these Hamaker constants are compared to prior work using Lifshitz theory and nonpolar probe IGC, the relative magnitudes can be ordered as follows: contact angle>Lifshitz>IGC. Furthermore, the dispersive surface energy components estimated here are in good agreement with those estimated by IGC. Due to these results, researchers and technologists will now have access to a comprehensive database of adhesion constants which describe the behavior of these energetic materials over a range of settings.
Analyzing surface forces for myriad geometric structures facilitates the design of properties in interacting interfacial systems. Along these lines, we demonstrate a generalized technique that can be utilized to evaluate the orientation dependence of a particle interacting with multiple finite or semi‐infinite objects. Specifically, the surface element integration technique is modified to account for surface elements of a particle not directly adjacent to the object with which it is interacting; this facilitates the analysis of objects with finite shape and with arbitrary orientations. Furthermore, as a technology‐relevant proof‐of‐concept demonstration, the influence of van der Waals (vdW) forces on the performance and reliability of microstructured systems used for the collection of trace particles is reported. The importance of the location of the particle contact with the microstructure and the independence of vdW forces generated by each microstructure is demonstrated using the developed computational approach. Thus, the methodology presented here can ultimately be utilized for a variety of interfacial forces generated by nontrivial systems with heterogeneous properties in order to provide design motifs in a low‐cost, high‐throughput manner.
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