We present the experimental observation of multiple resonance transport of light waves, due to necklace states, in disordered one-dimensional systems. Transmission phase measurements allow us to identify these states unambiguously and investigate their statistical properties. A theoretical model is developed to describe the resonance statistics and the frequency dependance of the localization length.
A detailed study of the structural disorder in wedge semiconductor microcavities ͑MC's͒ is presented. We demonstrate that images of the coherent emission from the MC surface can be used for a careful characterization of both intrinsic and extrinsic optical properties of semiconductor MC's. The polariton broadening can be measured directly, avoiding the well-known problem of inhomogeneous broadening due to the MC wedge. A statistical analysis of the spatial line shape of the images of the MC surface shows the presence of static disorder associated with dielectric fluctuations in the Bragg reflector. Moreover, the presence of local fluctuations of the effective cavity length can be detected with subnanometer resolution. The analysis of the resonant Rayleigh scattering ͑RRS͒ gives additional information on the origin of the disorder. We find that the RRS is dominated by the scattering of the photonic component of the MC polariton by disorder in the Bragg reflector. Also the RRS is strongly enhanced along the ͓110͔ and ͓11 0͔ directions. This peculiar scattering pattern is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.
A revisited realization of the Young's double slit experiment is introduced to directly probe the photonic mode symmetry by photoluminescence experiments. We experimentally measure the far field angular emission pattern of quantum dots embedded in photonic molecules. The experimental data well agree with predictions from Young's interference and numerical simulations. Moreover, the vectorial nature of photonic eigenmodes results in a rather complicated parity property for different polarizations, a feature which has no counterpart in quantum mechanics.
We directly investigate, by means of near-field spectroscopy, the spatial distribution of the optical cavity modes of 2D photonic crystal microcavities. Numerical simulations confirm that the photoluminescence maps of quantum dots embedded in the photonic structure qualitatively match the spatial modulation of the electric field intensity. r
It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurements and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.Introduction The origin of the polariton linewidth in strong coupling semiconductor microcavities (MCs) has been much discussed in recent years [1][2][3]. Particular attention has been paid to the role of static disorder in quantum wells (QWs) and the possibility of motional narrowing. In fact disorder plays a crucial role in the case of a QW embedded in a resonant optical cavity, termed a semiconductor MC, where the coherent exciton polariton is the basic physical picture. Therefore, resonant Rayleigh scattering (RRS), which arises directly from disorder, has recently received increasing attention [4][5][6][7][8][9][10]. The coupling between two-dimensional exciton and photon modes in a MC gives rise to several unique features of the RRS. For instance, RRS annular emission has recently been reported [4,5,8,9].We report on a detailed optical investigation in a wedged semiconductor MC after optical continuous-wave (cw) excitation, addressing the problems of a direct measurement of the intrinsic polariton linewidth and of the role of dielectric disorder in a Bragg reflector. We show that direct insights can be obtained by combining spatially resolved imaging (SRI) of the coherent emission from the MC surface and far-field (FF) angular distribution of the RRS.
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