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Electrical noise significantly limits the detectivity of infrared photodiode detectors. In this paper, we investigated the dark current and noise spectra for long-wave-infrared InAs/GaSb type-II superlattice (T2SL) detectors to study the origin of noise under various work conditions. The temperature-dependent I-V characteristics reveal a turning point near 90 K, below which the dominant dark current mechanism changes from Shockley-Hall-Read generation current and diffusion current to shunt current and trap-assisted tunneling (TAT) current. The contribution of shunt and tunneling process to the total 1/f noise are analyzed by fitting the noise power spectral density at 77 K for detectors. It is found that the TAT current dominates the 1/f noise at the reverse bias stronger than -0.1 V, while shunt current exhibits a larger contribution at the reverse bias less than -0.1 V with the shunt noise coefficient αshunt of 5×10−8. Furthermore, the leakage routes related to the shunt process and their temperature dependence are illustrated by two-dimensional photocurrent mapping.

In this paper, the chemical vapor deposition (CVD) processing for 4H-SiC epilayer is investigated with particular emphasis on the defects and the noise properties. It is experimentally found that the process parameters of C/Si ratio strongly affect the surface roughness of epilayers and the density of triangular defects (TDs), while no direct correlation between the C/Si ratio and the deep level defect Z1/2 could be confirmed. By adjusting the C/Si ratio, a decrease of several orders of magnitudes in the noise level for the 4H-SiC Schottky barrier diodes (SBDs) could be achieved attributing to the improved epilayer quality with low TD density and low surface roughness. The work should provide a helpful clue for further improving the device performance of both the 4H-SiC SBDs and the Schottky barrier ultraviolet photodetectors fabricated on commercial 4H-SiC wafers.