Unlike graded data of common semiconductor test results storing in relational databases, log data in the standard test data format (STDF) contain millions of test data entries. In a semiconductor packaging and testing factory, a semiconductor wafer or integrated circuit tests generate thousands of STDF files each day; therefore, how to store these massive databases is a crucial topic. Different products correspond to different test items and STDF content; if a relational database is used to store all forms of data, the practical operation becomes challenging. This paper used a NoSQL document-oriented database collocated with a Docker container to build a system, named the scalable STDF data (SSD) framework, for storing semiconductor test data. According to semiconductor test operations, the SSD framework first converts STDF files into an open standard format for data transmission and subsequently transfers them to the database. The use of NoSQL databases allows for flexibility of specifications of STDF content, and a Docker container exhibits features such as rapid deployment and high scalability. The SSD framework meets the requirements of semiconductor testing for throughput, latency, and parallel experimental projects; possesses excellent execution efficiency; and provides flexible data storage services in a semiconductor testing environment where processing a large quantity of data is required. From our simulation results, the major performance of the proposed system depends on the hardware properties. The higher hardware distribution degree provides better performance. Docker container provides more connections and the scalability of storage, but higher software distribution contributes limited performance enhancement. INDEX TERMS Flexible data storage, scalable STDF data, semiconductor testing, standard test data format.
On the purpose of detecting communities, many algorithms have been proposed for the disjointed community sets. The major challenge of detecting communities from the real-world problems is to determine the overlapped communities. The overlapped vertices belong to some communities, so it is difficult to be detected using the modularity maximization approach. The major problem is that the overlapping structure barely be found by maximizing the fuzzy modularity function. In this paper, we firstly introduce a node weight allocation problem to formulate the overlapping property in the community detection. We propose an extension of modularity, which is a better measure for overlapping communities based on reweighting nodes, to design the proposed algorithm. We use the genetic algorithm for solving the node weight allocation problem and detecting the overlapping communities. To fit the properties of various instances, we introduce three refinement strategies to increase the solution quality. In the experiments, the proposed method is applied on both synthetic and real networks, and the results show that the proposed solution can detect the nontrivial valuable overlapping nodes which might be ignored by other algorithms.
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