Spin tunnel junctions (CoFe/Al2O3/CoFe/MnIr) were fabricated with tunneling magnetoresistance (TMR) of 39%–41% after anneal at 300 °C, decreasing to 4%–6% after anneal at 410 °C. Junction resistance decreases from (0.8–1.6) to (0.5–0.8) M Ω μm2 during anneal. The pinned-layer moment decreases by 44% after anneal at 435 °C, but the free-layer moment does not change. The current–voltage characteristics change significantly and become asymmetric above 300 °C. Rutherford backscattering analysis (RBS) shows that above 300 °C, strong interdiffusion starts at the CoFe/MnIr interface with Mn moving into CoFe, causing the electrode moment to decrease. Mn eventually reaches the Al2O3/CoFe interface contributing to the TMR decrease. RBS analysis of a separate CoFe/Al2O3/CoFe structure shows only minor structural changes at the CoFe/Al2O3 interfaces after anneal at 435 °C, possibly leading to a second mechanism for the loss of interface polarization and TMR.

The thermal stability of CoFe/Al2O3/CoFe/MnIr spin-tunnel junctions fabricated by ion beam, using two oxidation methods is studied for annealing temperatures up to 450 °C. Tunnel magnetoresistance (TMR) is 40% after annealing at 300 °C, and a TMR of 15% is still achieved after annealing at 380 °C. The TMR decay with anneal depends on the oxidation process (O2 beam or remote plasma) and on the thickness of the MnIr exchange layer. Overoxidation of the Al, or higher kinetic energy of the O2 ions, during oxidation, lead to faster thermal degradation of the TMR. Thinner MnIr retards thermal degradation. Rutherford backscattering shows a strong interdiffusion of Mn into the CoFe electrode above 300 °C, but no significant changes are detected at the CoFe/Al2O3/CoFe interfaces, even after annealing at 435 °C (the junction resistance remains high confirming barrier stability). The pinned layer moment decreases upon annealing as expected from Mn incorporation. Also, the strong TMR decrease may indicate polarization loss when Mn reaches the Al2O3/CoFe interface. At 410 °C, the TMR is still 5%, with the fast switching characteristics of the free layer unchanged.

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A new approach to diabetic foot infections (DFIs) has been investigated, using a nisin-biogel combining the antimicrobial peptide (AMP) nisin with the natural polysaccharide guar-gum. Since in in vivo conditions bacteria may be exposed to decreased antimicrobial concentrations, known as subinhibitory concentrations (sub-MICs), effects of nisin-biogel sub-MIC values corresponding to 1/2, 1/4 and 1/8 of nisin’s minimum inhibitory concentration (MIC) on virulence expression by six Staphylococcus aureus DFI isolates was evaluated by determining bacteria growth rate; expression of genes encoding for staphylococcal protein A (spA), coagulase (coa), clumping factor A (clfA), autolysin (atl), intracellular adhesin A (icaA), intracellular adhesin D (icaD), and the accessory gene regulator I (agrI); biofilm formation; Coa production; and SpA release. Nisin-biogel sub-MICs decreased bacterial growth in a strain- and dose-dependent manner, decreased agrI, atl and clfA expression, and increased spA, coa, icaA and icaD expression. Biofilm formation increased in the presence of nisin-biogel at 1/4 and 1/8 MIC, whereas 1/2 MIC had no effect. Finally, nisin-biogel at sub-MICs did not affect coagulase production, but decreased SpA production in a dose-dependent manner. Results highlight the importance of optimizing nisin-biogel doses before proceeding to in vivo trials, to reduce the risk of virulence factor’s up-regulation due to the presence of inappropriate antimicrobial concentrations.

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indicate that general urologists may be referring mesh complications onto FPMRS providers, indicating that societal and FDA recommendations are perhaps not being adhered to.

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