We present a setup for temperature-dependent spectral generalized magneto-optical ellipsometry (SGME). This technique gives access to the electronic as well as the magnetic properties of ferromagnetic materials within one single magneto-optical measurement. It also allows the determination of the orientation of the magnetization. We show spectra of the real and the imaginary part of the refractive index N as well as the magneto-optical coupling parameter Q of permalloy and iron films for in-plane magnetization. Our findings demonstrate the relevance of SGME for the understanding of the interplay between electronic and magnetic properties of ferromagnetics.

We have measured the stray fields of thin permalloy (Ni 83 Fe 17 ) microstructures with different geometries and several thicknesses by magnetic-force microscopy ͑MFM͒. The MFM images are compared to corresponding images calculated from micromagnetic simulations. In particular, the type of 180°domain walls is discussed. We observe a transition from cross-tie to asymmetric Bloch walls between 70 and 100 nm film thickness. Good agreement between measurement and simulation is obtained.

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