Molecular orientation critically influences the mechanical, chemical, optical and electronic properties of organic materials. So far, molecular-scale ordering in soft matter could be characterized with X-ray or electron microscopy techniques only if the sample exhibited sufficient crystallinity. Here, we show that the resonant scattering of polarized soft X-rays (P-SoXS) by molecular orbitals is not limited by crystallinity and that it can be used to probe molecular orientation down to size scales of 10 nm. We first apply the technique on highly crystalline small-molecule thin films and subsequently use its high sensitivity to probe the impact of liquid-crystalline ordering on charge mobility in polymeric transistors. P-SoXS also reveals scattering anisotropy in amorphous domains of all-polymer organic solar cells where interfacial interactions pattern orientational alignment in the matrix phase, which probably plays an important role in the photophysics. The energy and q-dependence of the scattering anisotropy allows the identification of the composition and the degree of orientational order in the domains.

Polymer composites composed of poly(methyl methacrylate) (PMMA) and silica (14 nm diameter) have been investigated. The influences of sample preparation and processing have been probed. Two types of sample preparation methods were investigated: (i) solution mixture of PMMA and silica in methyl ethyl ketone and (ii) in situ synthesis of PMMA in the presence of silica. After removing all solvent or monomer, as confirmed using thermogravimetric analysis, and after compression molding, drops in T g of 5-15 8C were observed for all composites (2-12% w/w silica) and even pure polymer reference samples. However, after additional annealing for 72 h at 140 8C, all previously observed drops in T g disappeared, and the intrinsic T g of bulk, pure PMMA was again observed. This is indicative of nonequilibrium trapped voids being present in the as-molded samples. Field-emission scanning electron microscopy was used to show well-dispersed particles, and dynamic mechanical analysis was used to probe the mechanical properties (i.e., storage modulus) of the fully equilibrated composites. Even though no equilibrium T g changes were observed, the addition of silica to the PMMA matrices was observed to improve the mechanical properties of the glassy polymer host.

The successful integration of electron detection into an existing scanning transmission x-ray microspectroscope (STXM) at the Swiss Light Source is demonstrated. In conventional x-ray detection using a photomultiplier, STXM offers mainly bulk sensitivity combined with high lateral resolution. However, by implementation of a channeltron electron multiplier, the surface sensitivity can be established by the detection of secondary electrons emitted from the sample upon resonant excitation. We describe the experimental setup and discuss several relevant aspects, in particular the schemes to correct for self-absorption in the specimen due to back illumination in case of thicker films.

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The molecular interaction of dihydroxo[5,10,15,20-tetrakis(4-tert-butyl-phenyl)porphyrinato]-tin(IV) (SnTTBPP(OH)(2)), the structural order and growth of ultrathin films on Ag(100) have been studied by means of low-energy electron diffraction (LEED) and synchrotron based photoelectron spectroscopy, i.e., X-ray photoemission (XPS) and near-edge X-ray absorption fine structure (NEXAFS/XANES) spectroscopy. For the first time, monolayer adsorption of a metalloporphyrin with octahedral coordination of the metal center by two additional axial hydroxo ligands is investigated in a multi-technique study. The delicate balance of molecule-substrate interactions and intermolecular interactions leads to the formation of a densely-packed organic monolayer which is commensurate with the Ag(100) substrate. From NEXAFS linear dichroism an almost coplanar orientation of the porphyrin system is derived. XPS and NEXAFS clearly indicate that the axial hydroxo ligands are cleaved in monolayer films, i.e., upon adsorption to the Ag substrate. With increasing film thickness orientational order gets lost and leads to polycrystalline growth for thicker films as confirmed by scanning X-ray transmission microscopy (STXM).