A 14'La tracer has been used to ldentlfy the sources of cross-contamination when conventlonai hlgh-performance liquid chromatography was used to collect metal ion fractlons for subsequent analysls by a spectrometry or mass spectrometry. Major sources of memory effects ldentlfled were normal band broadenlng, sorptlon onto metal surfaces, and retentlon wlthln sample valves; secondary sorptlon effects wlthln the column and Isotopic exchange wlth sorbed metal Ions were not Important sources of memory effects. On the bask of these results a recommended procedure was developed that gives cross-contamlnatlon levels of 10.006 %. Sample preparation technlques for the a spectrometric and mass spectrometrlc analyses of the collected fractions are discussed, and some examples are given of appllcatlons to anaiytlcal problems In geochemlstry and the nuclear Industry. Good sample recoveries were obtained for the sample range studled (0.1-500 ng).USGS BCR-1 sample (0.5 g) was dissolved in HF and "OB,
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