A Mach–Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel’s coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.
Organic photorefractive polymer composites can be made to exhibit near 100% diffraction efficiency and fast writing times, though large external slants are needed to project the applied field onto the grating vector. We show here that the use of interdigitated electrodes on a single plane provides similar performance to these standard devices and geometries but without a external slant angle. This new device's structure also greatly improves the diffraction efficiency and sensitivity compared to less slanted standard devices necessary for some real applications, such as holographic displays, optical coherence imaging, and in-plane switching.
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