This investigation is devoted to grain boundaries, since, for high-frequency applications, eddy-current losses can be minimized by selectively increasing the resistivity of grain boundaries. Two specific commercial Mn-Zn ferrites were considered. The first one, selected to be a reference sample, exhibited good permeability, whereas the second one was chosen to promote a strong segregation of calcium on the grain boundaries via the addition of CaO and SiO 2 . To explain the behavior of this material chemical, crystallographical and electrical properties were collated. Initially, maps of potential barriers were recorded on a scale representative of the bulk microstructure by voltage contrast via scanning electron microscopy at 1 keV. In addition to the potential maps, the local electrical potential was measured quantitatively via local probing. It was evidenced that there was no percolation path through weak barriers at the grain boundaries. To gain information on very small voltage drops, in particular within grains, the microelectrode technique was used on the same areas. It showed a very different behavior between the two samples for the intragranular resistivity, as well as for interfacial barriers. Then, the crystallochemistry of the grain boundaries was investigated via analytical conventional transmission electron microscopy and scanning transmission electron microscopy techniques, and the specific segregation of calcium and the depletion of Fe 2؉ versus Fe 3؉ ions at general grain boundaries (GBs) was evidenced. The chemistry and microstructure of the grain boundaries were related to their crystallography. By local electrical probing via transmission electron microscopy, the interfacial barriers were directly related to the type of grain boundary. It was shown that high electrical barriers correspond to high-energy GBs, where there are no orientation relationships between adjacent grains; on the other hand, low-energy GBs, which present orientation relationships and/or dense interfacial planes, are characterized by low barriers.
In order to improve the capabilities of the electron-beam-induced current method, a technique based on scanning transmission electron-beam-induced current has been developed. It is shown that it enables the direct correlation of structural defects with their electrical activity. It implies the fabrication of ultrathin Schottky diodes (thickness ≤600 nm). From an approximate theoretical model it was inferred that the spatial resolution reaches about 200 nm in our experimental conditions. Experimental data are obtained on electron-grade and on upgrade metallurgical grade polycrystalline silicon, grown by the heat exchange method on which the behavior of carbon at grain boundaries and defects has been studied by transmission electron microscopy, high-resolution electron microscopy, and electron energy loss. There is a good agreement between the experimental data on electrical activity and the calculated approximation. The present method shows that the electrical activity is mainly related to the presence of impurities. Carbon seems to trap recombining impurities and specifically oxygen. Isolated dislocations are always electrically active whereas ‘‘clean’’ twin boundaries are not active. The activity at boundaries is always localized on extrinsic dislocations or on precipitates. Asymmetric profiles are also observed on boundaries and stacking faults. This was related to the existence of segregated zones lying on one side of these defects which are likely to act as diffusion barriers.
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