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In the last years system-level electrostatic discharges tests according to IEC 61000-4-2 have become widely used for component ESD qualification although it suffers from poor reproducibility. To minimize the disadvantages a so called Human Metal Model (HMM) measurement technique is momentarily in discussion and the standardization committee (SP5.6, ESDA) is working on its definition. The current stress waveform of HMM is identical to the IEC 61000-4-2 one. In this paper a new HMM pulse generator set-up based on a TLP pulse generator will be discussed. To get a deeper insight in the HMM method, discrete components, on-chip ESD test structures as well as a LIN transceiver were evaluated with this technique. The gained measurement results are compared with those resulting out of the IEC tests.

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