We report local spectra of the near-field thermal emission recorded by a Fourier transform infrared spectrometer, using a tungsten tip as a local scatterer coupling the near-field thermal emission to the far field. Spectra recorded on silicon carbide and silicon dioxide exhibit temporal coherence due to thermally excited surface waves. Finally, we evaluate the ability of this spectroscopy to probe the frequency dependence of the electromagnetic local density of states.

We analyze how a probing particle modifies the infrared electromagnetic near field of a sample.The particle, described by electric and magnetic polarizabilities, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show that the interaction with the sample can be accounted for by ascribing to the particle dressed polarizabilities that combine the effects of image dipoles with retardation. When calculated from these polarizabilities, the SNOM signal depends only on the fields without the perturbing tip. If the studied surface is not illuminated by an external source but heated instead, the signal is closely related to the projected electromagnetic local density of states (EM-LDOS). Our calculations provide the link between the measured farfield spectra and the sample's optical properties. We also analyze the case where the probing particle is hotter than the sample and evaluate the impact of the dressed polarizabilities on nearfield radiative heat transfer. We show that such a heated probe above a surface performs a surface spectroscopy, in the sense that the spectrum of the heat current is closely related to the local electromagnetic density of states. The calculations agree well with available experimental data.