Abstract:In this paper we characterize the polarimetric properties of a liquid crystal on silicon display (LCoS), including depolarization and diattenuation which are usually not considered when applying the LCoS in diffractive or adaptive optics. On one hand, we have found that the LCoS generates a certain degree (that can be larger than a 10%) of depolarized light, which depends on the addressed gray level and on the incident state of polarization (SOP), and can not be ignored in the above mentioned applications. The main origin of the depolarized light is related with temporal fluctuations of the SOP of the light reflected by the LCoS. The Mueller matrix of the LCoS is measured as a function of the gray level, which enables for a numerical optimization of the intensity modulation configurations. In particular we look for maximum intensity contrast modulation or for constant intensity modulation. By means of a heuristic approach we show that, using elliptically polarized light, amplitude-mostly or phase-mostly modulation can be obtained at a wavelength of 633 nm.
References and links
1.H.-K. Liu, J. A. Davis and R. A. Lilly, "Optical-data-processing properties of a liquid-crystal television spatial light modulator," Opt. Lett. 10, 635-637 (1985
Abstract:In this paper we provide evidence of the temporal fluctuations of the phase modulation property of a liquid crystal on silicon (LCoS) display, and we analyze its effect when the device is used for displaying a diffractive optical element. We use a commercial twisted nematic LCoS display configured to produce a phase-only modulation, and we provide time resolved measurements of the diffraction efficiency that show rapid fluctuations of the phase modulation, in the millisecond order. We analyze how these fluctuations have to be considered in two typical methods for the characterization of the phase modulation: two beam interference and diffraction from a binary grating. We finally provide experimental results on the use of this device for displaying a computer generated hologram. A reduction of the modulation diffraction efficiency results from the phase modulation fluctuation. Opt. Eng. 29, 240-246 (1990
A polarimetric method for the measurement of linear retardance in the presence of phase fluctuations is presented. This can be applied to electro-optic devices behaving as variable linear retarders. The method is based on an extended Mueller matrix model for the linear retarder containing the time-averaged effects of the instabilities. As a result, an averaged Stokes polarimetry technique is proposed to characterize both the retardance and its flicker magnitude. Predictive capability of the approach is experimentally demonstrated, validating the model and the calibration technique. The approach is applied to liquid crystal on silicon displays (LCoS) using a commercial Stokes polarimeter. Both the magnitude of the average retardance and the amplitude of its fluctuation are obtained for each gray level value addressed, thus enabling a complete phase characterization of the LCoS.
We show that both a lens and a nonuniform amplitude transmission filter can be encoded simultaneously onto a twisted nematic liquid-crystal spatial light modulator (SLM) working in the phase-only mode. The inherent equivalent apodization that is due to the pixelated structure of the SLM is compensated for. In addition, different types of nonuniform transmission pupil such as transverse apodizing, transverse hyperresolving, and axial hyperresolving (multifocusing) filters are implemented. The excellent agreement between numerical and experimental results shows the capability of this method to encode amplitude apodizers on a phase-only SLM.
Abstract:Recently we proposed a novel polarimetric method, based on Stokes polarimetry, enabling the characterization of the linear retardance and its flicker amplitude in electro-optic devices behaving as variable linear retarders. In this work we apply extensively the technique to parallelaligned liquid crystal on silicon devices (PA-LCoS) under the most typical working conditions. As a previous step we provide some experimental analysis to delimitate the robustness of the technique dealing with its repeatability and its reproducibility. Then we analyze the dependencies of retardance and flicker for different digital sequence formats and for a wide variety of working geometries.
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